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We have used X-ray fluorescence (XRF) and micro-Raman spectroscopy to evaluate elemental composition in different kind of building material samples. The characteristic X-rays from all targets were excited using radiation from radioactive source and detected in a high resolution semiconductor detector. Micro-Raman analysis was made by Renishaw RM 2000 instrument. Our investigation was inspired by assertions that some of those materials emit more than permissible radioactivities. Specimens were chose from our surroundings and date from about fifty years ago to present time. About twenty samples in total were measured. We haven't found significant differencies between elemental composition in specimens of same kind. [1] Dobrinić, J. ; Orlić, N. ; Kaliman, Z., Radiation Physics and Chemistry, 2004, 71, 801-3 [2] Martinez-Ramirez S. ; Frias, M. ; Domingo, C., Journal of Raman Spectroscopy, 2006, 37, 555-61.
X-ray fluorescence; micro-Raman; building material
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